The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Nov. 21, 2023
Applicant:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Inventors:

Matthew Lawrence Horner, Sound Beach, NY (US);

Darran Michael Handshaw, Sound Beach, NY (US);

Assignee:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/14 (2006.01); G06T 7/246 (2017.01); G06T 7/80 (2017.01); H04N 23/61 (2023.01); H04N 23/74 (2023.01);
U.S. Cl.
CPC ...
H04N 23/61 (2023.01); G06K 7/1413 (2013.01); G06T 7/246 (2017.01); G06T 7/80 (2017.01); H04N 23/74 (2023.01);
Abstract

Methods and systems for detecting an object scan approach path and optimizing an imaging assembly in response to the scan path are provided. Image data captured from one or more fields of views is used to identify an object and determine, over a series of images, a scan path of that object relative to the imaging assembly. From the scan path, a lead-in side and a lead-out side of the imaging assembly are determined and used to adjust operating parameters of the imaging assembly to bias toward a right side scanning configuration, a left side scanning configuration, or a central scanning configuration. These operating parameters may include adjusting the wakeup, exposure, illumination, indicia identification, and scan avoidance configurations, for example, for optimum scan path operation.


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