The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Dec. 30, 2020
Applicant:

Anacapa Semiconductor, Inc., Los Altos, CA (US);

Inventor:

Marc Loinaz, Los Altos Hills, CA (US);

Assignee:

Anacapa Semiconductor, Los Altos, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 3/06 (2006.01); G06F 1/12 (2006.01); H03K 5/133 (2014.01); H03K 5/135 (2006.01); H04L 7/00 (2006.01); H04L 12/40 (2006.01); H04Q 9/00 (2006.01);
U.S. Cl.
CPC ...
H04J 3/0667 (2013.01); H03K 5/133 (2013.01); H03K 5/135 (2013.01); H04J 3/0682 (2013.01); H04L 7/0037 (2013.01);
Abstract

A sensor network, which includes a sensor controller serially coupled to a plurality of sensor modules, is configured to program the sensor modules so as to transfer measurement data to the sensor controller and to synchronize the sensor modules to picosecond accuracy via on-chip or on-module custom circuits and a physical layer protocol. The sensor network has applications for use in PET, LiDAR or FLIM applications. Synchronization, within picosecond accuracy, is achieved through use of a picosecond time digitization circuit. Specifically, the picosecond time digitization circuit is used to measure on-chip delays with high accuracy and precision. The delay measurements are directly comparable between separate chips even with voltage and temperature variations between chips.


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