The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Jan. 26, 2024
Applicant:

Psemi Corporation, San Diego, CA (US);

Inventor:

Robert Mark Englekirk, Littleton, CO (US);

Assignee:

PSEMI CORPORATION, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 17/687 (2006.01); H01H 11/00 (2006.01); H03K 17/10 (2006.01); H03K 17/16 (2006.01); H03K 17/693 (2006.01); H03K 17/06 (2006.01);
U.S. Cl.
CPC ...
H03K 17/6871 (2013.01); H01H 11/00 (2013.01); H03K 17/102 (2013.01); H03K 17/161 (2013.01); H03K 17/693 (2013.01); H03K 2017/066 (2013.01); Y10T 29/49105 (2015.01);
Abstract

An RF switch to controllably withstand an applied RF voltage Vsw, or a method of fabricating such a switch, which includes a string of series-connected constituent FETs with a node of the string between each pair of adjacent FETs. The method includes controlling capacitances between different nodes of the string to effectively tune the string capacitively, which will reduce the variance in the RF switch voltage distributed across each constituent FET, thereby enhancing switch breakdown voltage. Capacitances are controlled, for example, by disposing capacitive features between nodes of the string, and/or by varying design parameters of different constituent FETs. For each node, a sum of products of each significant capacitor by a proportion of Vsw appearing across it may be controlled to approximately zero.


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