The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
May. 13, 2020
Applicant:
Micromass Uk Limited, Wilmslow, GB;
Inventors:
Assignee:
Micromass UK Limited, Wilmslow, GB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/06 (2006.01); G01N 27/623 (2021.01); H01J 49/00 (2006.01); H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
H01J 49/067 (2013.01); G01N 27/623 (2021.01); H01J 49/0027 (2013.01); H01J 49/401 (2013.01);
Abstract
An aperture plate assembly for an analytical instrument comprises a first sub-assembly comprising an aperture plate and a second sub-assembly comprising a guide. The first sub-assembly is configured to be attached to the second sub-assembly such that the aperture plate is positioned in a first position relative to the second sub-assembly. The first sub-assembly and the second sub-assembly are configured such that when the first sub-assembly is engaged by the guide, the aperture plate can be moved into the first position and the first sub-assembly can be attached to the second sub-assembly.