The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

May. 11, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Akinori Ebihara, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/22 (2022.01); G06F 17/18 (2006.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/22 (2022.01); G06F 17/18 (2013.01); G06V 10/82 (2022.01);
Abstract

A determination device includes an acquisition unit that sequentially acquires a plurality of elements included in series data related to a classification target, a score calculation unit that calculates an integrated score for binary classification of the classification target in each time the acquisition unit acquires the elements, a class determination unit that determines a determination result of the binary classification as one of a first class, a second class, and class indetermination, on the basis of comparison between the integrated score and the upper limit threshold value and the lower limit threshold value of the integrated score in each time the acquisition unit acquires the elements, and a remaining time estimation unit that calculates an index value of a remaining time required for the class determination unit to determine a final determination result of the binary classification as one of two classes.


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