The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
Oct. 06, 2021
Image analysis apparatus, image analysis method, and non-transitory computer-readable storage medium
Seiko Epson Corporation, Tokyo, JP;
Kei Kudo, Shiojiri, JP;
SEIKO EPSON CORPORATION, Tokyo, JP;
Abstract
An image analysis apparatus includes one or more processors configured to execute (a) acquiring, from a measurement device, spectral images for a plurality of wavelengths, obtained by imaging a measurement target, (b) acquiring a target range in each of the spectral images, (c) performing multivariate analysis of each pixel based on a gradation value of the pixel for each wavelength in the target range, (d) generating an analysis image including an analysis result of the multivariate analysis for each pixel in the target range, and (e) storing the generated analysis image into a memory.
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