The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
Mar. 10, 2020
Applicant:
Omron Corporation, Kyoto, JP;
Inventor:
Shiro Fujieda, Kyoto, JP;
Assignee:
OMRON CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/13 (2017.01); G06T 7/521 (2017.01); G06T 7/60 (2017.01); G06T 7/73 (2017.01); H04N 1/00 (2006.01); H04N 1/48 (2006.01); H04N 1/60 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); G06T 7/13 (2017.01); G06T 7/521 (2017.01); G06T 7/60 (2013.01); G06T 7/73 (2017.01); G06T 2200/24 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/30164 (2013.01); H04N 1/00135 (2013.01); H04N 1/484 (2013.01); H04N 1/60 (2013.01);
Abstract
An image processing system includes one or more processors that select one target algorithm from evaluation algorithms, calculate an evaluation value indicating adaptation to image measurement using the target algorithm and one or more evaluation images corresponding to an evaluation lighting pattern for each evaluation lighting pattern, and determine a lighting pattern to be used for the image measurement from evaluation lighting patterns based on the evaluation value.
Fujieda, Shiro. (2024). Image processing system that performs image measurement on target and adjust at least one of emission intensity and emission color for lighting elements, setting method, and program (U.S. Patent No. 12165305). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12165305
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