The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
May. 23, 2022
The Boeing Company, Chicago, IL (US);
Bryan Lilley, Saint Louis, MO (US);
Brittan A. Farmer, Madison, AL (US);
Troy Winfree, Seattle, WA (US);
Yadan Wu, Bellevue, WA (US);
Brian P. Justusson, Saint Peters, MO (US);
Jordan A. Severson, Saint Peters, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
A computer-based method for evaluating progressive damage in a metal test component includes providing Computed Tomography (CT) image data of the component to a processor and processing the CT image data via the processor, including detecting observable defects in the component. The method also includes characterizing the observable defects into corresponding defect categories, generating a data table of the observable defects and the corresponding defect categories, and embedding a collective set of data from the data table into a finite element model (FEM) of the component to thereby construct a modified FEM of the metal test component. Additionally, the method includes analyzing the modified FEM through an isotropic and/or anisotropic structural model, via the processor, to thereby generate a set of test results. A quality control action is then executed with respect to the metal test component based on the test results.