The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Sep. 07, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Masako Kashiwagi, Ageo Saitama, JP;

Nao Mishima, Tokyo, JP;

Akihito Seki, Yokohama Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/20 (2006.01); G06T 5/50 (2006.01); G06T 7/55 (2017.01);
U.S. Cl.
CPC ...
G06T 5/20 (2013.01); G06T 5/50 (2013.01); G06T 7/55 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/20081 (2013.01);
Abstract

According to one embodiment, an image processing device includes storage and a processor. The storage is configured to store a statistical model generated by learning bokeh that occurs in a first image affected by aberration of an optical system and varies non-linearly in accordance with a distance to a subject in the first image. The processor is configured to acquire a second image affected by the aberration of the optical system, perform color correction on the second image to reduce a number of colors expressed in the second image, and input a third image, obtained by performing the color correction on the second image, into the statistical model and acquire first distance information indicating a distance to a subject in the third image.


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