The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Nov. 26, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Kenichi Ogawa, Yamanashi, JP;

Takashi Nagatomi, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); G05B 19/4097 (2006.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G05B 13/0265 (2013.01); G05B 19/4097 (2013.01); G06N 20/00 (2019.01);
Abstract

A machine learning apparatus capable of reducing an error between a machined workpiece and a target shape when the workpiece is machined based on a workpiece model modeling the target shape of the workpiece. A machine learning apparatus includes a state observation section configured to observe machining state data of a machine tool configured to machine the workpiece, and measurement data of an error between a shape of the workpiece machined by the machine tool based on the workpiece model and the target shape, as a state variable representing a current state of environment in which the workpiece is machined, and a learning section configured to learn the correction amount in association with the error by using the state variable.


Find Patent Forward Citations

Ogawa, Kenichi. (2024). Machine learning apparatus, control device, machining system, and machine learning method for learning correction amount of workpiece model (U.S. Patent No. 12165078). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12165078

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…