The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Feb. 26, 2018
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Kiichiro Miyata, Toyonaka, JP;

Tanichi Ando, Komaki, JP;

Hiroyuki Miyaura, Tokyo, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

A factor estimation device is configured to receive information pertaining to objects, to extract state information from the information received, to identify a predetermined state pertaining to a first object from among the objects, to receive state information extracted that corresponds to the predetermined state and classify the predetermined state, to extract condition information from the information received, to identify the condition up until the predetermined state, and to receive condition information that is output by the condition-information extraction unit and corresponds to the condition identified and classify the condition identified. Subsequently, the factor estimation device is configured to estimate the condition that may result in the predetermined state on the basis of the result of classifying the predetermined state and the result of classifying the identified condition.


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