The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Jul. 01, 2021
Applicant:

Oxford University Innovation Limited, Botley, GB;

Inventors:

Zhenyu Cai, Harrogate, GB;

Simon Benjamin, Harrogate, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 10/70 (2022.01); G06F 11/07 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06N 10/70 (2022.01); G06F 11/0721 (2013.01); G06F 11/079 (2013.01); G06F 17/18 (2013.01);
Abstract

A method of mitigating errors in quantum computing, wherein the method comprises: performing (S) an operation on the state of a qubit in a group of qubits a plurality of times, wherein the operation has a first error rate, and wherein each performance of the operation comprises: performing a first operation comprising: a gate operation, a symmetry operation, and a first basis operation; or performing a second operation comprising: the gate operation, the symmetry operation, and a second basis operation; wherein the first and second basis operations are different basis operations selected from a set of basis operations; and measuring the state of the qubit; wherein the probability of performing the first operation is a first probability, and the probability of performing the second operation is a second probability; obtaining (S) a symmetry measurement for the group of qubits after each performance of the operation using the symmetry operation, wherein the group of qubits comprises a plurality of qubits; wherein the symmetry measurement is a first symmetry outcome if the number of errors is even or a second symmetry outcome if the number of errors is odd; obtaining (S) a first state measurement by determining the average state of the qubit for the first symmetry outcome; obtaining (S) a second state measurement by determining the average state of the qubit for the second symmetry outcome; fitting (S) the first state measurement to a first curve having the form (I); fitting the second state measurement to a second curve having the form (II); wherein n is an error rate and A and γ are fitting parameters; and extrapolating (S) the average state of the qubit at a second error rate using the first and second fitted curves; wherein the second error rate is lower than the first error rate.


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