The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
Jul. 14, 2021
Institute for Basic Science, Daejeon, KR;
Meeyoung Cha, Daejeon, KR;
Sungwon Han, Seongnam-si, KR;
Sungwon Park, Daejeon, KR;
Sundong Kim, Daejeon, KR;
Sungkyu Park, Seoul, KR;
INSTITUTE FOR BASIC SCIENCE, Daejeon, KR;
Abstract
Disclosed is an image analysis system which includes a first analyzer and a second analyzer. The first analyzer generates first features by encoding images through a first model and adjusts a weight of the first model based on the first features. The second analyzer generates second features based on the first features by encoding the images through a second model, classifies the second features into classes, respectively, and adjusts a weight of the second model based on mutual information and a correlation between a first class among the classes which features corresponding to an original image group from among the second features are classified as and a second class among the classes which features corresponding to an augmentation group of the original image group from among the second features are classified as.