The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
Jan. 03, 2023
Adobe Inc., San Jose, CA (US);
Vibhor Porwal, Bangalore, IN;
Yeuk-Yin Chan, Santa Clara, CA (US);
Vidit Bhatia, Modinagar, IN;
Subrata Mitra, Bangalore, IN;
Shaddy Garg, Bangalore, IN;
Sergey N Kazarin, Danville, CA (US);
Sameeksha Arora, Issaquah, WA (US);
Himanshu Panday, Noida, IN;
Gautam Pratap Kowshik, El Cerrito, CA (US);
Fan Du, Milpitas, CA (US);
Anup Bandigadi Rao, San Jose, CA (US);
Anil Malkani, Fremont, CA (US);
Adobe Inc., San Jose, CA (US);
Abstract
To retrieve information derived from a plurality of separately stored datasets, join structures are identified within the plurality of separately stored datasets. Join structures can include datasets joined by a central dataset, datasets joined by a single key, and datasets joined across a plurality of keys. Each of the join structures corresponds to a query processing schema that defines a sampling technique. When a join query is received as a SQL query, the join query identifies a portion of the plurality of separately stored datasets, from which a join structure is selected and a corresponding query processing schema is identified. The join query is reconstructed to form a reconstructed join query that comprises query processing schema instructions to derive the requested information using the sampling technique defined by the identified query processing schema.