The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

May. 17, 2023
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Umesh Pratap Singh, Hodal, IN;

Ajay Sharma, New Delhi, IN;

Ruchi Bora, Lucknow, IN;

Ashish Goel, Noida, IN;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/27 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 11/27 (2013.01); G01R 31/31703 (2013.01); G01R 31/318566 (2013.01); G06F 11/263 (2013.01);
Abstract

A memory built in self test (MBIST) controller of an MBIST circuit outputs first data. One or more errors is injected in the first data to produce second data. The second data is stored in the memory block. The memory block outputs the second data stored in the memory block. The MBIST controller receives the second data and detects an error in the second data based on a comparison with the first data, the error indicative of a failure of the MBIST. The MBIST controller provides an indication of failure of the MBIST to a processing core external to the MBIST circuit which performs diagnostic action in response to receiving the indication of failure of the MBIST. The processing core validates implementation of the diagnostic action.


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