The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Jul. 19, 2021
Applicant:

Samsung Electro-mechanics Co., Ltd., Suwon-si, KR;

Inventors:

Kyu Min Chae, Suwon-si, KR;

Eun Chong Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 13/00 (2006.01); G02B 9/64 (2006.01); G02B 27/00 (2006.01); H04N 23/55 (2023.01);
U.S. Cl.
CPC ...
G02B 13/0045 (2013.01); G02B 9/64 (2013.01); G02B 27/0025 (2013.01); H04N 23/55 (2023.01);
Abstract

An optical imaging system includes a first lens, a second lens, a third lens, a fourth lens, a fifth lens, a sixth lens and a seventh lens sequentially disposed from an object side. The optical imaging system satisfies |Pnu|[10° C.mm]≤30, where Pnu is ΣPnui in which i=1, 2, . . . , 7, Pnui is 1/(vti·fi), vti is [DTni/(ni−1)−CTEi], fi is an effective focal length of an i-th lens, ni is a refractive index of the i-th lens, DTni is a rate (dni/dT) of change of the refractive index according to a temperature of the i-th lens, and CTEi is a thermal expansion coefficient of the i-th lens.


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