The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
Mar. 29, 2021
Artilux, Inc., Menlo Park, CA (US);
Tim K. Shia, Zhubei, TW;
Yun-Chung Na, Zhubei, TW;
Artilux, Inc., Menlo Park, CA (US);
Abstract
Described are systems and methods for ToF imaging of a target. The ToF imaging system includes an optical splitter that splits the light beam from a light source into multiple transmitting light beams. The transmitting light beams are directed towards a target, and one or more portions return as reflected light beams. A detector generates detector signals, representative of the reflected light beams. An electronically-controlled mirror is used to change the angular position of the transmitting light beams incident on the target, so that different regions of the target can be measured at different time instants. The ToF imaging system uses a flash and scan process to flash one region(s) of the target with the transmitting light beams during one sub-frame exposure and to scan other region(s) of the target during subsequent sub-frame exposures. An image processing apparatus constructs target information from multiple sub-frame exposure.