The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
Jun. 28, 2021
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Yan You, Beijing, CN;
Ziran Zhao, Beijing, CN;
Xuming Ma, Beijing, CN;
Kai Wang, Beijing, CN;
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
A security inspection apparatus and a method of controlling the same are described. An example security inspection apparatus includes a bottom plate configured to carry an inspected object and a two-dimensional multi-input multi-output array panel, including at least one two-dimensional multi-input multi-output sub-array. Each two-dimensional multi-input multi-output sub-array includes transmitting antennas and receiving antennas arranged such that equivalent phase centers are arranged in a two-dimensional array. The security inspection apparatus includes a control circuit configured to control the transmitting antennas to transmit a detection signal in a form of an electromagnetic wave to the inspected object in a preset order, and to control the receiving antennas to receive an echo signal from the inspected object. The security inspection apparatus includes a signal processing device configured to reconstruct an image of an inspected object based on an echo signal received and a display device configured to display the reconstructed image.