The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
Nov. 19, 2020
Apb Corporation, Tokyo, JP;
APB CORPORATION, Tokyo, JP;
Abstract
An examination method includes bringing conductor probes into contact with surfaces of an examination target to measure voltage or electric resistance at points on the surfaces of the examination target, and determining whether or not the voltage or the electric resistance is out of an allowable range at any of the points. The examination target is a resin current collector, an electrode sheet having an active material layer laminated on a resin current collector, a separator-attached electrode sheet in which a separator is combined with an electrode sheet, or a unit cell including one set of a positive electrode resin current collector, a positive electrode active material layer, a separator, a negative electrode active material layer, and a negative electrode resin current collector, which are laminated in order. With the examination method, a defect such as a short circuit can be easily found and production yield can be improved.