The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
Oct. 27, 2022
Versitech Limited, Hong Kong, CN;
City University of Hong Kong, Hong Kong, CN;
Ning Xi, Hong Kong, CN;
Song Wang, Hong Kong, CN;
Pengtao Liu, Hong Kong, CN;
Zhiyong Sun, Hong Kong, CN;
Lixin Dong, Hong Kong, CN;
Chaojian Hou, Hong Kong, CN;
Donglei Chen, Hong Kong, CN;
Wenqi Zhang, Hong Kong, CN;
VERSITECH LIMITED, Hong Kong, CN;
City University of Hong Kong, Hong Kong, CN;
Abstract
A nano scale robotic system for single cell DNA sequencing of a strand of DNA positioned on a slide utilizes an atomic force microscope (AFM) having an end effector in the form of a cantilever with a tip. The AFM causes its cantilever tip to scan over the base pairs of the DNA strand. A pair of spaced-apart electrodes at the tip makes contact with opposite sides of the DNA strand and the current between bases of the DNA strand is measured by a current measurement system connected to the electrodes. An artificial intelligence-based data analytic system determines the DNA sequence based on the current from the current measuring system. The AFM tip is guided over the DNA strand by comparing compressed desired intensity local scan images and compressed actual intensity local scan images and using the difference to control the location of the tip.