The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Mar. 03, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Hirobumi Shiohata, Tokyo, JP;

Yuichiro Ota, Tokyo, JP;

Takaaki Hagiwara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1002 (2013.01); G01N 2035/00891 (2013.01); G01N 2035/0494 (2013.01);
Abstract

Proposed is a technique for facilitating work of cause investigation of a defect by an operator. The present disclosure proposes an automatic analyzer including: a reagent dispensing unit configured to aspirate a reagent from a reagent vessel that contains the reagent, and discharge the reagent into a reaction vessel that contains a reaction liquid containing a sample; a storage unit configured to store a type of the sample and concentration-related information determined for each type of the sample and related to a concentration of a component to be measured contained in the sample; a detection unit configured to detect a measurement concentration that is the concentration of the component to be measured contained in the reaction liquid; and a determination unit configured to determine whether an abnormality occurs in the reagent vessel based on the concentration-related information and the measurement concentration.


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