The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
May. 13, 2022
Raytheon Technologies Corporation, Farmington, CT (US);
Brigid A. Blakeslee, Hamden, CT (US);
Francesca Stramandinoli, West Hartford, CT (US);
Amit Surana, Newington, CT (US);
Mahmoud El Chamie, Rocky Hill, CT (US);
Ozgur Erdinc, Mansfield, CT (US);
RTX CORPORATION, Farmington, CT (US);
Abstract
A method of inspecting a component for anomalous regions includes recording a plurality of sensor readings using one or more sensors, each reading corresponding to a different region of the component; determining an appearance metric for each reading; and determining a nominal appearance metric based on individual values of the appearance metric for a first subset of the readings. The method includes, for a particular sensor reading outside the first subset: determining a difference between the nominal appearance metric and the appearance metric of the particular sensor reading; updating the nominal appearance metric based on the particular sensor reading; and, based on the difference exceeding a threshold: determining that the particular sensor reading is anomalous and corresponds to an anomalous region of the component, and recording additional sensor readings of the anomalous region using one or more sensing parameters that differ from those used to record the anomalous sensor reading.