The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
Jul. 27, 2018
Hifi Engineering Inc., Calgary, CA;
Adekunle Adeyemi, Calgary, CA;
Seyed Ehsan Jalilian, Calgary, CA;
HIFI ENGINEERING INC., Calgary, CA;
Abstract
A computer-implemented method of providing access to interferometric system data stored in a data repository. A query that includes a data parameter identifier is received. The data repository is accessed and the interferometric system data is stored in the data repository using a data structure that has one or more data parameter arrays and one or more corresponding data group members. Each data group member includes one or more data arrays each associated with a data parameter in the corresponding data parameter array. Using the data parameter identifier, one or more target data parameters are determined from among the one or more data parameter arrays. One or more target data arrays that correspond to the one or more target data parameters are determined from among the one or more data arrays. The interferometric system data, which is in the one or more target data arrays, is extracted.