The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Sep. 28, 2022
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Atsushi Goto, Nagano, JP;

Eiichi Ohara, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/045 (2006.01);
U.S. Cl.
CPC ...
B41J 2/0451 (2013.01); B41J 2/04586 (2013.01);
Abstract

A recording apparatus includes a first nozzle row and a second nozzle row, and a control unit configured to control ejection of liquid, the control unit is configured to cause the nozzle row to perform scan of ejecting the liquid while moving, and when recording a first pattern including a first overlapping region and a first normal region by controlling the first nozzle row and recording a second pattern including a second overlapping region and a second normal region by controlling the second nozzle row, the first overlapping region is formed at a position overlapping the second normal region as viewed in a longitudinal direction, the first overlapping region being an overlapping region where a raster line is formed by performing the scan m times, the first normal region being where the raster line is formed by performing the scan n times, n being smaller than m.


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