The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Sep. 29, 2021
Applicant:

SK Enpulse Co., Ltd., Gyeonggi-do, KR;

Inventors:

Jong Wook Yun, Seoul, KR;

Jae In Ahn, Gyeonggi-do, KR;

Eun Sun Joeng, Gyeonggi-do, KR;

Hye Young Heo, Gyeonggi-do, KR;

Jang Won Seo, Seoul, KR;

Assignee:

SK ENPULSE CO., LTD., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 29/00 (2006.01); C08J 9/32 (2006.01); H01L 21/306 (2006.01);
U.S. Cl.
CPC ...
B24B 29/00 (2013.01); C08J 9/32 (2013.01); H01L 21/30625 (2013.01); C08J 2203/22 (2013.01); C08J 2205/044 (2013.01); C08J 2207/00 (2013.01); C08J 2375/04 (2013.01);
Abstract

The present disclosure relates to a polishing pad, a method of manufacturing the polishing pad, and a method of manufacturing a semiconductor device using the same. In the polishing pad, an unexpanded solid-phase blowing agent is included in a polishing composition when a polishing layer is manufactured, and the unexpanded solid-phase blowing agent is expanded during a curing process to form a plurality of uniform pores in the polishing layer, such that defects occurring on a surface of the semiconductor substrate may be prevented. In addition, the present disclosure may provide a method of manufacturing a semiconductor device to which the polishing pad is applied.


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