The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Feb. 06, 2019
Applicant:

Siemens Energy Global Gmbh & Co. KG, Munich, DE;

Inventor:

Ole Geisen, Berlin, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/0622 (2014.01); B22F 10/00 (2021.01); B22F 10/28 (2021.01); B22F 10/36 (2021.01); B22F 10/366 (2021.01); B22F 10/38 (2021.01); B22F 12/43 (2021.01); B23K 26/06 (2014.01); B23K 26/342 (2014.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/00 (2015.01); B22F 10/25 (2021.01); B23K 26/082 (2014.01); B23K 101/00 (2006.01); B23K 103/08 (2006.01);
U.S. Cl.
CPC ...
B23K 26/0622 (2015.10); B22F 10/00 (2021.01); B22F 10/36 (2021.01); B22F 10/366 (2021.01); B23K 26/0608 (2013.01); B23K 26/342 (2015.10); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/00 (2014.12); B22F 10/25 (2021.01); B22F 10/28 (2021.01); B22F 10/385 (2021.01); B22F 12/43 (2021.01); B23K 26/082 (2015.10); B23K 2101/001 (2018.08); B23K 2103/08 (2018.08);
Abstract

A method for selectively irradiating a material layer in additive production. The method includes: providing geometry data having geometry information of individual layers of a component that is to be produced by additive means, and defining an irradiation pattern for the layers by a computer-supported production method, wherein the irradiation pattern has a contour and a surface region in layers, wherein first contour vectors of the contour are specified for continuous irradiation operation and second contour vectors of the contour are specified for pulsed irradiation operation. A method for providing a data set, an additive production method, a corresponding device and a corresponding computer program product selectively irradiate a material layer in additive production.


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