The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Jul. 12, 2019
Applicant:

Nagravision Sàrl, Cheseaux-sur-Lausanne, CH;

Inventors:

Nils Amiet, Cheseaux-sur-Lausanne, CH;

Yolan Romailler, Cheseaux-sur-Lausanne, CH;

Assignee:

NAGRAVISION SARL, Cheseaux-sur-Lausanne, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/30 (2006.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
H04L 9/302 (2013.01); G06F 16/2379 (2019.01);
Abstract

A testing method for verifying keys uses a dataset of integers, the dataset being previously split into subsets of the integers, each subset of the integers having a product data structure for a product of the integers in the subset. Each ordered pair of subsets in the dataset has a remainder data structure for factors of the integers in the subsets of the ordered pair. The method includes creating a subset including integers to be added to the dataset of integers, and generating a product data structure for the created subset, the product data structure based on computing a product of the integers in the created subset. The method also includes identifying distinct ordered pairs of subsets, each distinct ordered pair of subsets including a subset from the dataset and the created subset.


Find Patent Forward Citations

Loading…