The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

May. 06, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Yu Tanaka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/00 (2006.01); G05F 1/46 (2006.01); H02M 1/00 (2007.01); H02M 1/36 (2007.01); H02M 3/156 (2006.01);
U.S. Cl.
CPC ...
H02M 1/0045 (2021.05); G01R 33/0023 (2013.01); G05F 1/465 (2013.01); G05F 1/467 (2013.01); H02M 1/0067 (2021.05); H02M 1/0083 (2021.05); H02M 1/36 (2013.01); H02M 3/156 (2013.01);
Abstract

A measurement apparatus includes a linear regulator, a switching regulator, an acquisition unit configured to acquire measurement data by sensing a signal as a measurement target, and a control unit configured to selectively drive the linear regulator or the switching regulator, wherein the control unit is configured to select and drive the linear regulator in a first period in which the measurement data is acquired by the acquisition unit, and select and drive the switching regulator in a second period that is different from the first period.


Find Patent Forward Citations

Tanaka, Yu. (2024). Measurement apparatus, control method for measurement apparatus, and measurement system (U.S. Patent No. 12160164). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12160164

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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