The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Dec. 14, 2022
Applicant:

Cirrus Logic International Semiconductor Ltd., Edinburgh, GB;

Inventors:

Marco A. Janko, Austin, TX (US);

Filippo Rossi, London, GB;

Hamid Sepehr, London, GB;

Kyle Wilkinson, South Lake Tahoe, CA (US);

Emmanuel A. Marchais, Dripping Springs, TX (US);

Vadim Konradi, Austin, TX (US);

Anil Lal, Hounslow, GB;

Aleksey S. Khenkin, Lago Vista, TX (US);

Chin Huang Yong, Austin, TX (US);

Assignee:

Cirrus Logic Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 6/00 (2006.01);
U.S. Cl.
CPC ...
G08B 6/00 (2013.01);
Abstract

A method for determining and mitigating over-excursion of an internal mass of an electromechanical transducer may include measuring a sensed signal associated with the electromechanical transducer in response to a driving signal driven to the electromechanical transducer, determining a non-linearity value based on the sensed signal, mapping the non-linearity value to a probability of over-excursion of the internal mass, and applying a gain to a signal path configured to generate the driving signal based on the probability.


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