The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2024
Filed:
Sep. 17, 2022
Carl Zeiss Meditec Ag, Jena, DE;
Manuel Steidle, Aalen, DE;
Andreas Raab, Neuler, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A surgical microscope includes an image capture unit having an image sensor, a detection beam path, an image evaluation unit, a connection region for attaching a protective glass module with an objective protective glass. The image sensor has a detection region which has a used detection region for capturing the object region, and a partial detection region, which is not assigned to the used detection region. The image capture unit is configured such that, when the protective glass module with the objective protective glass is arranged at the connection region, a detail of the protective glass module with the objective protective glass is capturable by the partial detection region of the image sensor. The image evaluation unit is configured to generate a signal when an objective protective glass is detectable by the evaluation of the image data of the partial detection region of the image sensor.