The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Aug. 28, 2022
Applicant:

Wuhan University, Wuhan, CN;

Inventors:

Zhaocong Wu, Wuhan, CN;

Zhao Yan, Wuhan, CN;

Assignee:

WUHAN UNIVERSITY, Wuhan, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/579 (2017.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/579 (2017.01); G06T 2207/30244 (2013.01);
Abstract

An automatic precision calculation method of a pose of a rotational linear array scanning image includes: obtaining a collection parameter of the rotational linear array scanning image and a camera intrinsic parameter; based on the above parameters, projecting the rotational linear array scanning image to its tangent plane by orthographic projection transformation to generate an equivalent frame image having the approximately same intrinsic and extrinsic parameters as the rotational linear array scanning image and calculate a coordinate of each pixel of the equivalent frame image projected onto the rotational linear array scanning image based on an inverse projection transformation calculation method; by using structure-from-motion method, automatically calculating a pose parameter of the equivalent frame image and a corresponding waypoint three-dimensional coordinate; with the pose parameter of the equivalent frame image as an initial value, obtaining an accurate imaging parameter of the rotational linear array scanning image.


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