The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Jul. 25, 2019
Applicant:

Siemens Industry Software Inc., Plano, TX (US);

Inventors:

Gaurav Ameta, Robbinsville, NJ (US);

Suraj Ravi Musuvathy, Princeton Junction, NJ (US);

Elena Arvanitis, Somerville, NJ (US);

David Madeley, Louth, GB;

Omar Fergani, Berlin, DE;

Tom van 't Erve, Enschede, NL;

Livio Dalloro, Plainsboro, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B22F 10/366 (2021.01); B22F 10/38 (2021.01); B22F 10/85 (2021.01); B22F 12/90 (2021.01); B29C 64/153 (2017.01); B29C 64/393 (2017.01); B33Y 10/00 (2015.01); B33Y 50/02 (2015.01); G06F 30/20 (2020.01); B22F 10/28 (2021.01); G06F 113/10 (2020.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); B22F 10/366 (2021.01); B22F 10/38 (2021.01); B22F 10/85 (2021.01); B22F 12/90 (2021.01); B29C 64/153 (2017.08); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 50/02 (2014.12); G06F 30/20 (2020.01); B22F 10/28 (2021.01); G06F 2113/10 (2020.01); G06T 2207/20108 (2013.01); G06T 2207/30144 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A computing system may include an access engine and a defect detection engine. The access engine may be configured to access a slice contour of a given layer of a 3-dimensional (3D) object designed for manufacture through an additive manufacturing process and obtain hatch tracking for the slice contour, the hatch tracking representative of an energy path to melt metal powder for constructing the given layer through the additive manufacturing process. The defect detection engine may be configured to construct, from the slice contour, an as-built image for the given layer by rendering the hatch tracking in the slice contour; construct, from the slice contour, an idealized image for the given layer; and identify defects in the given layer via image analysis between the as-built image and the idealized image.


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