The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2024
Filed:
Jan. 04, 2023
Samsung Electronics Co., Ltd., Suwon-si, KR;
Seongwook Yoon, Seoul, KR;
Sanghoon Sull, Seoul, KR;
Jaehyun Kim, Anyang-si, KR;
Heejeong Lim, Seoul, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION, Seoul, KR;
Abstract
A method of obtaining and imputing missing data and a measurement system having the same are disclosed. The method includes obtaining measurement values of measurement variables, among z variables corresponding to z components of a measurement object, wherein z is a natural number greater than 1, and the z variables of the measurement object include measurement variables and missing variables which are not measured, and the measurement variables are of an amount less than z; generating missing data having the measurement variables with the measurement values and the missing variables with missing values in the z components, wherein each of the missing values is predetermined value indicating that a missing variable has not been measured; generating k pieces of final imputation data having k final imputation values, by using the missing data, wherein k is a natural number greater than 1, each of the k final imputation values are in the z components, and using the missing data includes performing multiple imputations on the missing data; and generating average data having average component values in the z components, wherein each of the average component values in a component is an average value of the k final imputation values of the k pieces of final imputation data in the component, and selecting, in each of the z components, a next measurement variable, wherein a difference value between a final imputation values and an average component value, of the next measurement variable, is larger than a difference value of the missing variables.