The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2024
Filed:
Dec. 14, 2020
Luminar Technologies, Inc., Orlando, FL (US);
Pranav Maheshwari, Palo Alto, CA (US);
Vahid R. Ramezani, Los Altos, CA (US);
Benjamin Englard, Palo Alto, CA (US);
István Peter Burbank, Orlando, FL (US);
Shubham C. Khilari, Palo Alto, CA (US);
Meseret R. Gebre, Palo Alto, CA (US);
Austin K. Russell, Orlando, FL (US);
Luminar Technologies, Inc., Orlando, FL (US);
Abstract
A method for determining a scan pattern according to which a sensor equipped with a scanner scans a field of regard (FOR) is presented. The method comprises obtaining, by processing hardware, a plurality of objective functions, each of the objective functions specifying a cost for a respective property of the scan pattern, expressed in terms of one or more operational parameters of the scanner. The method further includes applying, by the processing hardware, an optimization scheme to the plurality of objective functions to generate the scan pattern. The method further includes scanning the FOR according to the generated scan pattern.