The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Mar. 20, 2020
Applicant:

Shenzhen Mindray Bio-medical Electronics Co., Ltd., Shenzhen, CN;

Inventors:

Wentao Ju, Shenzhen, CN;

Ersheng Li, Shenzhen, CN;

Yanwen Weng, Shenzhen, CN;

Jun Wang, Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/025 (2013.01); G01N 2035/0443 (2013.01);
Abstract

An automatic analysis apparatus and an operating method therefor. A temporary storage portion is introduced, a multi-component test project may be divided into new one-step test processes, or a multi-step test process may be divided into new one-step test processes, and test sequences and processes may be re-entered, so that each mechanism, unit and control time sequence may be designed according to one-step test processes in a standard and orderly manner, so as to solve the problem that multi-component test projects and multi-step test processes disturb normal processes, thereby effectively increasing the test speed and the test throughput of the whole machine.


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