The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2024
Filed:
Jun. 26, 2020
Sacmi Cooperativa Meccanici Imola Societa' Cooperativa, Imola, IT;
Donato Laico, Imola, IT;
Manuel Giorgi, Casola Valsenio, IT;
Abstract
An apparatus () and a method for optical inspection of parisons () made of thermoplastic material comprises: a conveyor () comprising a pair of lateral, under-flange guidesA for holding each parison by its flange, and configured to transport the parisons () in succession along an inspection path; an inspection station (), located along the inspection path and including at least one inspection camera (), configured to capture image data of a parison () positioned in the inspection station (), wherein the conveyor () has a first operating configuration for transporting parisons () of a first size and a second operating configuration for transporting parisons () of a second size, different from the first size, the conveyor () including at least one adjustment actuator (), configured to move the conveyor () between the first and the second operating configuration.