The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2024
Filed:
Jun. 08, 2021
Carl Zeiss Spectroscopy Gmbh, Jena, DE;
Clemens Michael Bier, Eisleben, DE;
Torsten Büttner, Jena, DE;
Michael Barth, Erfurt, DE;
Felix Kerstan, Jena, DE;
CARL ZEISS SPECTROSCOPY GMBH, Jena, DE;
Abstract
In accordance with a method for calibrating structurally identical spectrometers for constituent analysis, a multiplicity of samples are provided and concentrations of one constituent in the individual samples are measured using a reference measuring method. Spectra of the individual samples are measured using one spectrometer selected from the structurally identical spectrometers to determine a preliminary regression model. At least one spectrum is selected from the measured spectra and/or a mean value spectrum formed from the measured spectra. A multiplicity of error spectra are generated using a mathematical model of the structurally identical spectrometers. The individual error spectra are added in each case to the individual selected spectra to obtain simulated spectra. As a result, a resultant regression model is determined in which amplitude values of the measured spectra and selected simulated spectra form the independent variables and in which the reference measurement values form the dependent variable.