The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2024
Filed:
Oct. 23, 2020
Sony Group Corporation, Tokyo, JP;
Koji Kita, Kanagawa, JP;
Sony Group Corporation, Tokyo, JP;
Abstract
Multicolor analysis is enabled while suppressing increase in size. An optical measurement apparatus according to an embodiment is provided with: an excitation light source (to) that emits excitation light; a waveguide optical system () that guides the excitation light to a predetermined position along a predetermined light path; a fluorescence detection system () that detects fluorescence radiated from a particle by excitation of the particle present at the predetermined position by the excitation light; and a first scattered-light detection system () that detects first scattered light generated by scattering of the excitation light by the particle present at the predetermined position; wherein the waveguide optical system includes a separation optical system () that separates the fluorescence and the first scattered light among the light emitted in a predetermined direction from the predetermined position on the flow channel, the fluorescence detection system detects the fluorescence separated by the separation optical system, and the first scattered-light detection system detects the first scattered light separated by the separation optical system.