The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Jan. 13, 2023
Applicant:

Subcom, Llc, Eatontown, NJ (US);

Inventor:

Rong Zhu, Eatontown, NJ (US);

Assignee:

SubCom, LLC, Eatontown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); G01K 11/322 (2021.01); G01L 1/24 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35364 (2013.01); G01K 11/322 (2021.01); G01L 1/242 (2013.01); G01M 11/3109 (2013.01);
Abstract

Methods of measuring an anomaly, any induced change in physical parameters such as strain, temperature, and so forth, in an optical fiber. One method may include launching a plurality of probe pulses from a probe source; recording a Brillouin scattering spectrum from a plurality of reflection signals generated in the optical fiber, responsive to the plurality of probe pulses; determining a relative motion between the optical fiber and the anomaly during the recording the Brillouin back-scattering spectrum; and dynamically adjusting the Brillouin back-scattering spectrum according to the relative motion, or performing an adjustment of the Brillouin back-scattering spectrum after acquisition of the Brillouin back-scattering spectrum.


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