The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Jan. 10, 2022
Applicant:

Hydro Extrusion Usa, Llc, Rosemont, IL (US);

Inventors:

Edward J. Vinarcik, West Lafayette, IN (US);

Michael Zajac, Dickson, TN (US);

Daniel Biorn, Yankton, SD (US);

Assignee:

HYDRO EXTRUSION USA, LLC., Rosemont, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01C 3/08 (2006.01); G01S 17/48 (2006.01);
U.S. Cl.
CPC ...
G01B 11/02 (2013.01); G01C 3/08 (2013.01); G01S 17/48 (2013.01);
Abstract

A system for measuring a length of a work piece including a leveling fixture disposed at a first end of the work piece and a range target disposed at a second end. The leveling fixture includes a precision stop abutting against the first end and range finders configured to be substantially aligned with the first end. The range target includes a target stop abutting against the second end and a vertical portion substantially aligned with the second end when the target stop abuts the second end. The range finders are each configured to take measurements between the range finders and the vertical portion of the range target so as to provide a measurement of the length of the work piece.


Find Patent Forward Citations

Vinarcik, Edward. (2024). Systems and methods for fabricated part measurement (U.S. Patent No. 12158331). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12158331

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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