The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Jan. 18, 2023
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Eiji Komamiya, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/045 (2006.01);
U.S. Cl.
CPC ...
B41J 2/04505 (2013.01); B41J 2/04586 (2013.01);
Abstract

Provided is a technique capable of obtaining a high-quality image without enhancing the arrangement accuracy of chips in a print head. In the print head, first and second chips respectively having first and second nozzle arrays are arranged. End regions of the first and second nozzle arrays form an overlapping portion (OL) where they overlap in view from a conveyance direction. An image processing apparatus allocates pieces of print data to the nozzles in the first and second nozzle arrays based on an inter-nozzle distance. At this time, the image processing apparatus performs a process of shifting allocation positions of the pieces of print data relative to the nozzles from the allocation positions in a state where the inter-nozzle distance is normal, and changes a distribution process of distributing the pieces of print data to the nozzles in the overlapping portion, according to the inter-nozzle distance.


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