The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Oct. 05, 2021
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Koji Funami, Kyoto, JP;

Kazuki Fujiwara, Osaka, JP;

Izuru Nakai, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/046 (2014.01); B23K 11/36 (2006.01); B23K 26/08 (2014.01); B23K 26/38 (2014.01); B23K 26/70 (2014.01); B23K 37/04 (2006.01);
U.S. Cl.
CPC ...
B23K 26/046 (2013.01); B23K 11/36 (2013.01); B23K 26/0869 (2013.01); B23K 26/38 (2013.01); B23K 26/707 (2015.10); B23K 37/0417 (2013.01);
Abstract

An evaluation method for evaluating laser machining in which irradiation region of a laser beam is moved relative to object to perform machining of object, includes a measurement step and an evaluation step. In the measurement step, a change in an intensity of light according to a movement of measurement region is measured by moving measurement region for measuring the intensity of light, relative to object. In the evaluation step, an evaluation of the laser machining is performed based on the change in the intensity of light according to the movement of measurement region. In the measurement step, measurement region is moved relative to object so that movement path of measurement region has a plurality of intersections with movement path of irradiation region.


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