The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2024
Filed:
Oct. 30, 2020
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
George Themelis, Lindau, DE;
Leica Instruments (Singapore) Pte Ltd., Singapore, SG;
Abstract
Examples relate to a surgical microscope system and a corresponding apparatus, method and computer program. The surgical microscope system comprises one or more sensors for providing sensor information about a balance of the surgical microscope system. The surgical microscope system comprises one or more brakes for holding at least one component of the surgical microscope system in place. The surgical microscope system comprises a surgical microscope. The surgical microscope system comprises a processing module, configured to process the sensor information. The processing module is configured to determine an information about the balance of the surgical microscope system. In some embodiments, the processing module is configured to provide a warning to a user of the surgical microscope system based on the information about the balance of the surgical microscope system. The warning indicates danger of imbalance in the surgical microscope system. Alternatively or additionally, the processing module may be configured to control a release of the one or more brakes based on the information about the balance of the surgical microscope system.