The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2024
Filed:
Dec. 02, 2020
Koninklijke Philips N.v., Eindhoven, NL;
Christian Haase, Hamburg, DE;
Christian Buerger, Hamburg, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to matching a field of view for mobile 3D imaging, for example mobile C-arm 3D imaging In order to provide image data that is improved for comparing purposes, for example when using a mobile X-ray imaging system, first location information of a first reconstruction volume based on a first sequence of X-ray images of a region of interest of a subject acquired along a first trajectory in a first position of an X-ray imaging device is received. Further, a planned second trajectory for acquiring a second sequence of X-ray images in a second position of the X-ray imaging device is received and a resulting second reconstruction volume for the second sequence of X-ray images is calculated. Then, second location information for the second reconstruction volume is determined. Further, a degree of comparability for the first reconstruction volume and the second reconstruction volume is determined based on the first location information and the second location information. An adapted second trajectory is calculated that results in an increased degree of comparability of the first reconstruction volume and the second reconstruction volume. The adapted second trajectory is provided for acquiring the second sequence of X-ray images in the second position of the X-ray imaging device.