The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2024

Filed:

Jan. 16, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Takamichi Inoue, Tokyo, JP;

Shinichi Anami, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/391 (2015.01); H04B 17/23 (2015.01); H04W 24/08 (2009.01); H04W 84/12 (2009.01);
U.S. Cl.
CPC ...
H04B 17/391 (2015.01); H04B 17/23 (2015.01); H04W 24/08 (2013.01); H04W 84/12 (2013.01);
Abstract

The wireless communication quality visualization deviceincludes condition setting meanswhich sets measurement condition that can identify a target whose communication quality is measured, and extraction condition that can identify data to be displayed in data on communication quality collected according to the measurement condition, and display data generation meanswhich generates display data for displaying spatial and temporal communication quality based on the data extracted according to the extraction condition.


Find Patent Forward Citations

Inoue, Takamichi. (2024). Wireless communication quality visualization system, wireless communication quality visualization device, and measurement apparatus (U.S. Patent No. 12155422). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12155422

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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