The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2024

Filed:

Feb. 23, 2021
Applicant:

Fuji Electric Co., Ltd., Kawasaki, JP;

Inventor:

Masashi Akahane, Matsumoto, JP;

Assignee:

FUJI ELECTRIC CO., LTD., Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02M 3/155 (2006.01); H02M 1/088 (2006.01); H02M 7/5387 (2007.01); H03K 17/567 (2006.01); H02M 1/00 (2006.01);
U.S. Cl.
CPC ...
H02M 7/5387 (2013.01); H02M 1/088 (2013.01); H02M 3/155 (2013.01); H03K 17/567 (2013.01); H02M 1/0054 (2021.05); H03K 2217/0063 (2013.01); H03K 2217/0072 (2013.01);
Abstract

A power module including a plurality of drive devices. Each drive device includes a high-side drive element and a low-side drive element that drive a load, a high-side control circuit that controls the high-side drive element, and a low-side control circuit that controls the low-side drive element. Each of the high-side and low-side control circuits includes an abnormality detection circuit that detects an abnormal state of the high-side or low-side drive element, a capability-switch-function-equipped drive circuit that switches a drive capability of the high-side or low-side drive element, responsive to the detection of the abnormal state by any one of the abnormality detection circuits in the plurality of drive devices, and a drive capability switch circuit that switches a drive capability of the capability-switch-function-equipped drive circuit, responsive to the detection of the abnormal state by the abnormality detection circuit.


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