The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2024

Filed:

Sep. 29, 2020
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Kenichi Mishima, Kyoto, JP;

Kengo Takeshita, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/16 (2006.01); H01J 49/00 (2006.01); G01N 27/623 (2021.01);
U.S. Cl.
CPC ...
H01J 49/0004 (2013.01); H01J 49/161 (2013.01); G01N 27/623 (2021.01);
Abstract

The present invention provides an imaging mass spectrometer which generates ions by irradiating a sample with a laser beam and performs mass spectrometry of the ions, the imaging mass spectrometer including: a laser irradiation unitconfigured to emit the laser beam toward the sample, a condensing optical systemdisposed between the laser irradiation unitand the sample and configured to condense the laser beam emitted from the laser irradiation unit, an image acquiring unitconfigured to acquire a condensing state checking image which is an optical microscopic image capable of checking a condensing state on the sample of the laser beam emitted from the laser irradiation unit, and a display unitconfigured to display the condensing state checking image acquired by the image acquiring uniton a display screen.


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