The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2024

Filed:

Nov. 24, 2022
Applicant:

Nanya Technology Corporation, New Taipei, TW;

Inventor:

Wei-Chun Chen, Changhua County, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 29/46 (2006.01);
U.S. Cl.
CPC ...
G11C 29/1201 (2013.01); G11C 29/12015 (2013.01); G11C 29/46 (2013.01);
Abstract

A testing method includes the following steps of: accessing a memory chip to put the memory chip into a write leveling mode; inputting a strobe signal into the memory chip under the write leveling mode; adjusting signal edges of the strobe signal to sample a clock state of a clock signal in the memory chip under the write leveling mode; generating a data signal according to the strobe signal under the write leveling mode; and determining types of the memory chip according to the data signal under the write leveling mode.


Find Patent Forward Citations

Chen, Wei-Chun. (2024). Testing method and testing system (U.S. Patent No. 12154641). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12154641

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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