The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Aug. 11, 2021
Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;
BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
Provided are an image defect detection method and apparatus, an electronic device, a storage medium and a product. The method includes acquiring a to-be-detected image; obtaining a restored image corresponding to the to-be-detected image based on the to-be-detected image, at least one mask image group and a plurality of defect-free positive sample images, where each mask image group includes at least two binary images having a complementary relationship, and different mask image groups have different image sizes; and locating a defect of the to-be-detected image based on the to-be-detected image and each restored image. The solution solves the problem in which a related defect detection method requires numerous manual operations and has a low detection accuracy due to subjective factors of a worker.