The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Sep. 26, 2023
Topcon Corporation, Tokyo, JP;
Takeshi Kikuchi, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
A bar arrangement inspection result display system includes a surveying instrument, an eyewear display device including a display, a relative position sensor and a relative direction sensor, and a processor for manage coordinate spaces of the eyewear display device and the surveying instrument in a space with an origin set at a common reference point. The processor is configured to generate a three-dimensional model of a bar arrangement inspection range based on three-dimensional point cloud data of the inspection range, generate three-dimensional inspection result display data by associating bar arrangement inspection result data of the inspection range in which detail and position of bar arrangement error are associated with each other with the three-dimensional model, and display three-dimensional inspection result image by superimposing on actual objects observed with the eyewear display device in such a manner that the bar arrangement error is recognizable.